At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...
SoftJin, a provider of Customized Automation software for Electronic Design and Manufacturing, announces NxDAT, software for efficient Analysis of Defects identified by Mask Inspection Systems. The ...
IMDEA Software researchers Facundo Molina, Juan Manuel Copia and Alessandra Gorla present FIXCHECK, a novel approach to improve patch fix analysis that combines static analysis, randomized testing and ...
The approach toward software testing has drastically changed over the years. It has changed from manual testing to automation frameworks and now to AI-based testing. It isn’t just about increasing ...
A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...
I recently had to update my password on a site that I joined many, many years ago -- far enough in the past that a "good enough" password was "any five characters." The site now wanted me to have a ...
Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Results that may be inaccessible to you are currently showing.
Hide inaccessible results
Feedback