Consists of chapters selected and translated by C. G. I. Friedlaender and G. Aletan from the editor's Handbuch der Mikroskopie in der Technik. "Tables and diagrams to chapter by G. Rehwald" (24 p.
PORTLAND, Ore. — FEI Co. (Hillsboro, Ore.) will unveil a family of transmission electron microscopes (TEM) next week that it says will enable atomic-scale imaging and analysis of semiconductor wafers.
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