This paper defines a method to measure the chip die pad capacitance using time delay reflectometry (TDR). This method is useful for measuring the low-value capacitance that is present at the end of a ...
Depending upon the distance between the surface of a capacitance probe and a target source, the electrical capacitance that is formed between these two objects will vary. In an effort to improve ...
An optimal way to determine an op amp's input capacitance. Steps involved in making the input-capacitance measurement. 1. With a series resistor at the op-amp input, the input capacitance of the op ...
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